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Measurement of Atomic Fractions in Cu(In,Ga)Se2 Films by Auger Electron Spectroscopy (AES) and Energy Dispersive Electron Probe Microanalysis (ED-EPMA)

Published online by Cambridge University Press:  27 August 2014

Vasile-Dan Hodoroaba ,
Thomas Wirth ,
Ralf Terborg ,
Kyung Joong Kim  and
Wolfgang E. S. Unger
Vasile-Dan Hodoroaba
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, Berlin 12200, Germany
Thomas Wirth
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, Berlin 12200, Germany
Ralf Terborg
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany
Kyung Joong Kim
Affiliation:
Korea Research Institute of Standards and Science, Division of Industrial Metrology, Daejeon 305-340, Republic of Korea
Wolfgang E. S. Unger
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, Berlin 12200, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 402 - 403
Copyright
Copyright © Microscopy Society of America 2014 

References

Jang, J S, Hwang, H H, et al., Metrologia 49 (2012), p. 522.Google Scholar
Hodoroaba, V-D, Kim, K J, et al., Surf. Interface Anal. 44 (2012), p. 1459.Google Scholar
Abou-Ras, D, Caballero, R, et al., Microsc. Microanal. 17 (2011), p. 728.Google Scholar
CASINO software package for Monte Carlo simulation of electron trajectories in solids, http://www.gel.usherbrooke.ca/casino/What.html.Google Scholar