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Measures to Reduce X-ray Noise in a CCD High Quality Image Camera for HVEM

Published online by Cambridge University Press:  01 August 2005

K Yoshida ,
T Furutsu ,
S Shimojo  and
H Mori
K Yoshida
Affiliation:
Osaka University, Japan
T Furutsu
Affiliation:
Hitachi High-Technologies, Osaka, Japan
S Shimojo
Affiliation:
Osaka University, Japan
H Mori
Affiliation:
Osaka University, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 614 - 615
Copyright
© 2005 Microscopy Society of America