Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-23T21:00:00.406Z Has data issue: false hasContentIssue false
  • English
  • Français

Measuring Non-uniformities in GaN/AlN Quantum Wells

Published online by Cambridge University Press:  24 July 2003

K. A. Mkhoyan ,
H. Wu ,
W. J. Schaff ,
L. F. Eastman  and
J. Silcox
K. A. Mkhoyan
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853
H. Wu
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853
W. J. Schaff
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853
L. F. Eastman
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853
J. Silcox
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 816 - 817
Copyright
Copyright © Microscopy Society of America 2003