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Measuring Non-uniformities in GaN/AlN Quantum Wells

Published online by Cambridge University Press:  24 July 2003

K. A. Mkhoyan ,
H. Wu ,
W. J. Schaff ,
L. F. Eastman  and
J. Silcox
K. A. Mkhoyan
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853
H. Wu
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853
W. J. Schaff
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853
L. F. Eastman
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853
J. Silcox
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 816 - 817
Copyright
Copyright © Microscopy Society of America 2003