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Measuring Strain Fields surrounding Grain-Boundary Dislocations in Silicon using Scanning Transmission Electron Microscopy
Published online by Cambridge University Press: 27 August 2014
Abstract
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- Abstract
- Information
- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1048 - 1049
- Copyright
- Copyright © Microscopy Society of America 2014
References
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