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Mechanism of FIB-Induced Phase Transformation in Austenitic Steel

Published online by Cambridge University Press:  29 November 2021

Joseph R. Michael Open the ORCID record for Joseph R. Michael [Opens in a new window] ,
Lucille A. Giannuzzi ,
M. Grace Burke  and
Xiang Li Zhong
Joseph R. Michael*
Affiliation:
Sandia National Laboratory, PO Box 5800, Albuquerque, NM87185-0886, USA
Lucille A. Giannuzzi
Affiliation:
L.A. Giannuzzi & Associates LLC, Fort Myers, FL33913USA
M. Grace Burke
Affiliation:
Materials Performance Centre, Department of Materials, University of Manchester, ManchesterM13 9PL, UK
Xiang Li Zhong
Affiliation:
Department of Materials, University of Manchester, Oxford Road, ManchesterM13 9PL, UK
*
*Corresponding author: Joseph R. Michael, E-mail: jrmicha@sandia.gov
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Abstract

The transformation of unstable austenite to ferrite or α′ martensite as a result of exposure to Xe+ or Ga+ ions at room temperature was studied in a 304 stainless steel casting alloy. Controlled Xe+ and Ga+ ion beam exposures of the 304 were carried out at a variety of beam/sample geometries. It was found that both Ga+ and Xe+ ion irradiation resulted in the transformation of the austenite to either ferrite or α′ martensite. In this paper, we will refer to the transformation product as a BCC phase. The crystallographic orientation of the transformed area was controlled by the orientation of the austenite grain and was consistent with either the Nishiyama–Wasserman or the Kurdjumov–Sachs orientation relationships. On the basis of the Xe+ and Ga+ ion beam exposures, the transformation is not controlled by the chemical stabilization of the BCC phase by the ion species, but is a result of the disorder caused by the ion-induced recoil motion and subsequent return of the disordered region to a more energetically favorable phase.

Keywords

austeniteFIBgalliumphase transformationxenon
Type
Materials Science Applications
Information
Microscopy and Microanalysis , Volume 28 , Issue 1 , February 2022 , pp. 70 - 82
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

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