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A Method of Component Extraction of EDS and EELS maps

Published online by Cambridge University Press:  23 September 2015

Shixin Wang
Shixin Wang*
Affiliation:
Micron Technology, Inc., 8000 S. Federal Way, Boise, ID 83707, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1643 - 1644
Copyright
Copyright © Microscopy Society of America 2015