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Methods for Scanning Transmission Electron Microscopy High Angle Annular Dark Field Based for Three Dimensional Analysis of the Local Composition in Solid Alloys

Published online by Cambridge University Press:  27 August 2014

E. Rotunno ,
V. Grillo ,
T. Markurt ,
T. Remmele  and
M. Albrecht
E. Rotunno
Affiliation:
CNR-IMEM, Parco delle Scienze 37a, I-43100 Parma, Italy. (12pt)
V. Grillo
Affiliation:
CNR-Istituto Nanoscienze, Centro S3, Via G Campi 213/a, I-41125 Modena, Italy
T. Markurt
Affiliation:
Leibniz Institute for Crystal Growth, Max-Born-Strasse 2, 12489 Berlin, Germany
T. Remmele
Affiliation:
Leibniz Institute for Crystal Growth, Max-Born-Strasse 2, 12489 Berlin, Germany
M. Albrecht
Affiliation:
Leibniz Institute for Crystal Growth, Max-Born-Strasse 2, 12489 Berlin, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 594 - 595
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Voyles, P.M., Grazul, J.L., Muller, D.A. Ultramicroscopy 96 (2003) 251–273.Google Scholar
[2] Carlino, E., Grillo, V. Physical Review B 71 (2005) 235303.Google Scholar
[3] Benthem, K.v., Lupini, A.R., Kim, M., et al., Appl. Phys. Lett. 87, 034104 (2005).Google Scholar
[4] Peng, Y., Nellist, P. D.and Pennycook, S. J. Journal of Electron Microscopy 53 (2004)257.Google Scholar