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Mica Aspect Ratios Measured by Scanning White Light Interference Microscopy

Published online by Cambridge University Press:  01 August 2005

R A Rose  and
T B Vander Wood
R A Rose
Affiliation:
MVA Scientific Consultants
T B Vander Wood
Affiliation:
MVA Scientific Consultants

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 2004 - 2005
Copyright
© 2005 Microscopy Society of America