It is my pleasure to welcome you to Microscopy and Microanalysis 2002, jointly sponsored by the Microscopy Society of America, Microbeam Analysis Society, Microscopy Society of Canada/Société de Microscopie du Canada, and the International Metallographic Society. An excellent program with an outstanding list of invited speakers for symposia has been assembled by the Program Committee consisting of the Chair, Edgar Voelkl, and Co-Chairs, David Piston (MSA), Raynald Gauvin (MAS/MSC), and Allan Lockley (IMS). Highlights of Microscopy and Microanalysis 2002 include the world's largest display of microscopes and related technologies together with outstanding sessions on all aspects of microscopy and microanalysis. Symposia will be held on 3-D electron microscopy of macromolecules and cryo-electron microscopy of macromolecules, the quantitative aspects of X-ray microscopy, confocal microscopy, biomaterials, biological and materials specimen preparation. Special sessions will be held on holography, phase imaging, deep tissue imaging, (S)TEM instrumentation, developments in focused-ion beam instruments and imaging, metallographic specimen preparation from start to finish, and the changing role of atom probe microscopes in the nanotechnology era. Advances in immunolabeling, EELS, and detectors for X-ray microanalysis also will be presented. A special analytical electron microscopy session honoring the work of Elmar Zeitler is also scheduled. A pre-meetingworkshop “Future of Materials Characterization of Charging Materialsusing Microbeam Analysis” organized by Dr. Raynald Gauvin will be held at McGill University in Montreal on August 2–3. The Local Arrangements Committee, headed by Pierre Charest, has coordinated the scheduling of many local events to complement the meeting.