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Microstructural characteristics of GaN/AlN thin films grown on a Si (110) substrate by molecular beam epitaxy: Transmission electron microscopy study
Published online by Cambridge University Press: 25 July 2016
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1576 - 1577
- Copyright
- © Microscopy Society of America 2016
References
[10] This research was supported by Nano-Material Technology Development Program (Next-Generation Nano Fundamental Technology Development Program) through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (grant number 2011-0030233).Google Scholar