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Microstructural Characterization of Aerospace Materials via Serial Sectioning Using the Dual Beam FIB-SEM

Published online by Cambridge University Press:  01 August 2005

M Uchic ,
M Groeber ,
R Wheeler IV ,
R Kerns ,
F Scheltens  and
D Dimiduk
M Uchic
Affiliation:
Air Force Research Laboratory, Wright–Patterson AFB, Ohio
M Groeber
Affiliation:
The Ohio State University
R Wheeler IV
Affiliation:
UES Inc., Dayton, Ohio
R Kerns
Affiliation:
UES Inc., Dayton, Ohio
F Scheltens
Affiliation:
UES Inc., Dayton, Ohio
D Dimiduk
Affiliation:
Air Force Research Laboratory, Wright–Patterson AFB, Ohio

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 666 - 667
Copyright
© 2005 Microscopy Society of America