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Microstructural Investigation of Multi-state Resistive Switching Characteristics in Multi-layered Platinum/Tantalum Oxide using In-situ TEM

Published online by Cambridge University Press:  23 September 2015

Seong-Il Kim ,
Seung-Pyo Hong  and
Young-Woon Kim

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1047 - 1048
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Wong, H. -S. P., et al, Proceeding of the IEEE 100 (2012). p 1951.CrossRefGoogle Scholar
[2] Kurnia, F., et al, Phys. Status Solidi RRL 5 (2011). p 253.CrossRefGoogle Scholar
[3] Hur, J. H., et al, Nanotechnology 23 (2012) 225702.CrossRefGoogle Scholar
[4] This research was supported by the Nano-Material Technology Development Program through the National Research Foundation of Korea funded by the Ministry of Science, ICT & Future Planning (2011-0019984).Google Scholar