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Minimizing 6-fold Symmetry and Chromatic Aberration by Using Ultra High Resolution Lens in Cs-Corrected STEM

Published online by Cambridge University Press:  01 August 2010

K Nakamura ,
H Inada ,
M Konno ,
Y Suzuki  and
K Kimoto
K Nakamura
Affiliation:
Hitachi High-Technologies Corp, Japan
H Inada
Affiliation:
Hitachi High-Technologies Corp, Japan
M Konno
Affiliation:
Hitachi High-Technologies Corp, Japan
Y Suzuki
Affiliation:
Hitachi High-Technologies Corp, Japan
K Kimoto
Affiliation:
National Institute for Materials Science, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 136 - 137
Copyright
Copyright © Microscopy Society of America 2010