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Modeling Contrasts in Variable Pressure Scanning Electron Microscopes

Published online by Cambridge University Press:  01 August 2002

Raynald Gauvin ,
Hendrix Demers ,
Kevin Robertson  and
James Finch
Raynald Gauvin
Affiliation:
Department of Mining, Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2
Hendrix Demers
Affiliation:
Department of Mining, Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2
Kevin Robertson
Affiliation:
Department of Mining, Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2
James Finch
Affiliation:
Department of Mining, Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 452 - 453
Copyright
Copyright © Microscopy Society of America 2002