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Modelling Spatially-Resolved Electron Energy-Loss Spectra in the Low-Loss Region

Published online by Cambridge University Press:  22 July 2022

Andrea Konečná ,
Jordan A. Hachtel ,
Pavel Gallina ,
Fadil Iyikanat ,
Juan-Carlos Idrobo ,
Tomáš Šikola  and
Javier García de Abajo
Andrea Konečná*
Affiliation:
 Central European Institute of Technology, Brno University of Technology, 612 00 Brno, Czech Republic
Jordan A. Hachtel
Affiliation:
 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Pavel Gallina
Affiliation:
 Central European Institute of Technology, Brno University of Technology, 612 00 Brno, Czech Republic Institute of Physical Engineering, Brno University of Technology, 616 69 Brno, Czech Republic
Fadil Iyikanat
Affiliation:
ICFO-Institut de Ciencies Fotoniques, The Barcelona Institute of Science and Technology, 08860 Castelldefels (Barcelona), Spain
Juan-Carlos Idrobo
Affiliation:
Department of Materials Science & Engineering, University of Washington, Seattle, WA, USA
Tomáš Šikola
Affiliation:
 Central European Institute of Technology, Brno University of Technology, 612 00 Brno, Czech Republic Institute of Physical Engineering, Brno University of Technology, 616 69 Brno, Czech Republic
Javier García de Abajo
Affiliation:
ICFO-Institut de Ciencies Fotoniques, The Barcelona Institute of Science and Technology, 08860 Castelldefels (Barcelona), Spain  ICREA-Institució Catalana de Recerca i Estudis Avançats, 08010 Barcelona, Spain
*
*Corresponding author: andrea.konecna@vutbr.cz

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2550 - 2552
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Copyright
Copyright © Microscopy Society of America 2022

References

Hage, FS et al. , Science 367 (2020), p. 1124-1127. doi:10.1126/science.aba1136CrossRefGoogle Scholar
Yan, X et al. , Nature 589 (2021), p. 65-69. doi:10.1038/s41586-020-03049-yCrossRefGoogle Scholar
Konečná, A et al. , Small 17 (2021), p. 2170201. doi:10.1002/smll.202170201CrossRefGoogle Scholar
Gallina, P et al. , arXiv:2112.12832 (2021), https://arxiv.org/pdf/2112.12832.pdfGoogle Scholar
Konečná, A, Iyikanat, F and García de Abajo, FJ, ACS Nano 15 (2021), p. 9890-9899. doi: 10.1021/acsnano.1c01071CrossRefGoogle Scholar
This work has been supported in part by ERC (Adv. Grant 789104-eNANO), EU (101017720-eBEAM and 964591-SMARTe, H2020-Twininning project 810626 – SINNCE), MICINN (PID2020-112625GB-I00 and CEX2019-000910-S) and by the Czech Science Foundation (Grant No.*20-28573S*). The STEM and EELS experiments were supported by the Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy, Office of Science User Facility, and conducted using instrumentation within ORNL's Materials Characterization Core provided by UT-Batelle, LLC, under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy, and sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U.S. Department of Energy.Google Scholar
We thank Prof. JH Edgar, Dr. J Li and Dr. J Liška for their contribution to the experimental part of the presented work.Google Scholar