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Multilayer Thin Films as Pseudo-Homogeneous EDX Standards

Published online by Cambridge University Press:  23 September 2015

Hendrik O. Colijn ,
Jonathan Orsborn ,
Daniel Chmielewski  and
David W. McComb
Hendrik O. Colijn
Affiliation:
Ohio State University, Center for Electron Microscopy & Analysis, Columbus, OH, USA
Jonathan Orsborn
Affiliation:
Ohio State University, Center for Electron Microscopy & Analysis, Columbus, OH, USA
Daniel Chmielewski
Affiliation:
Ohio State University, Electrical & Computer Engineering, Columbus, OH, USA
David W. McComb
Affiliation:
Ohio State University, Center for Electron Microscopy & Analysis, Columbus, OH, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1641 - 1642
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] see e.g Williams, D.B. & Carter, C.B., Transmission Electron Microscopy: A Textbook for Materials Science. Springer (2009) . chapter 35.Google Scholar
[2] van Capellen, E., Microsc. Microanal. Microstruct 1 (1990) . pp. 1–22.Google Scholar
[3] The authors acknowledge support from The Ohio State University and the Ohio Third Frontier Research Scholar program.Google Scholar