Crossref Citations
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Crossref.
Keenan, Michael R.
Smentkowski, Vincent S.
Ulfig, Robert M.
Oltman, Edward
Larson, David J.
and
Kelly, Thomas F.
2011.
Atomic-Scale Phase Composition through Multivariate Statistical Analysis of Atom Probe Tomography Data.
Microscopy and Microanalysis,
Vol. 17,
Issue. 3,
p.
418.
Keenan, Michael R.
and
Smentkowski, Vincent S.
2011.
Simple statistically based alternatives to MAF for ToF‐SIMS spectral image analysis.
Surface and Interface Analysis,
Vol. 43,
Issue. 13,
p.
1616.
Miller, M. K.
2012.
Characterization of Materials.
p.
1.
Lu, Ping
and
Gauntt, Bryan D.
2013.
Structural Mapping of Disordered Materials by Nanobeam Diffraction Imaging and Multivariate Statistical Analysis.
Microscopy and Microanalysis,
Vol. 19,
Issue. 2,
p.
300.