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Nanocharacterization of Strontium Titanate Thin Films and Oxide-Electrode Interfaces in Resistive Switching Devices

Published online by Cambridge University Press:  25 July 2016

William J. Bowman ,
Eva Sediva ,
Peter Crozier  and
Jennifer L.M. Rupp
William J. Bowman
Affiliation:
School for the Engineering of Matter, Transport and Energy, Arizona State University Electrochemical Materials Group, ETH Zürich, Zürich, Switzerland
Eva Sediva
Affiliation:
Electrochemical Materials Group, ETH Zürich, Zürich, Switzerland
Peter Crozier
Affiliation:
School for the Engineering of Matter, Transport and Energy, Arizona State University
Jennifer L.M. Rupp
Affiliation:
Electrochemical Materials Group, ETH Zürich, Zürich, Switzerland

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1568 - 1569
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Messerschmitt, F., Kubicek, M., Schweiger, S. & Rupp, J.L.M. Adv. Func. Mat 24 (2014) 7448.CrossRefGoogle Scholar
[2] Kubicek, M., Schmitt, R., Messerschmitt, F. & Rupp, J.L.M. ACS Nano 9 (2015) 10737.CrossRefGoogle Scholar
[3] Muenstermann, R., Menke, T., Dittmann, R. & Waser, R. Adv. Mat 22 (2010) 4819. 4. J.J. Yang, 4. J.P. Strachan, Q. Xia, D.A.A. Ohlberg, et al., Adv. Mat. 22 (2010), 4034.CrossRefGoogle Scholar
[4] We acknowledge ScopeM at ETH Zürich, and thank the staff for their support. This work wassupported by the Swiss NSF (project 155986). W.J.B. was a Swiss Government Excellence Scholarshipholder for the academic year 2015-2016 (ESKAS 2015.1183); and acknowledges financial support ofthe US NSF Graduate Research Fellowship Program (DGE-1311230).Google Scholar