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Nanocrystalline Diamond Grids for FIB Specimen Preparation and S/TEM Analytics
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Type
- Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
The NCD grid design and methods for EXLO are covered under US Patents 8,740,209; 8,789,826; 10,522,324; 10,801,926.Google Scholar
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