Hostname: page-component-77c89778f8-7drxs Total loading time: 0 Render date: 2024-07-24T18:19:44.634Z Has data issue: false hasContentIssue false
  • English
  • Français

Nano-Dot Markers for Electron Tomography Formed by Electron Beam-Induced Deposition: Nanoparticle Agglomerates Application

Published online by Cambridge University Press:  27 August 2014

Misa Hayashida ,
Marek Malac ,
Michael Bergen  and
Peng Li
Misa Hayashida
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
Marek Malac
Affiliation:
National Institute of Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Canada Department of Physics, University of Alberta, T6G 2E1, Edmonton, Canada
Michael Bergen
Affiliation:
National Institute of Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Canada
Peng Li
Affiliation:
National Institute of Nanotechnology, 11421 Saskatchewan Drive, Edmonton, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 782 - 783
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Lawrence, M.C, in: Frank, J. (Ed.), ElectronTomography.PlenumPress, NewYork (1992)197.Google Scholar
[2] Hayashida, M, Iijima, T, Fujimotu, T and Ogawa, S, Micron, 43 (2012), 992-995.Google Scholar
[3] Hayashida, M, Iijima, T, Tsukahara, M and Ogawa, S, Micron, 50 (2013), 29-34.Google Scholar
[4] Hayashida, M et. al, (Submitted to Ultramicroscopy).Google Scholar
[5] Bergen, M et. al. Microscopy and Microanalysis 19 (S2), 1394-1395 (2013).Google Scholar