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Nanoscale Correlative Imaging of Low-Z elements by in-situ Secondary Ion Mass Spectrometry in a Transmission Electron Microscope

Published online by Cambridge University Press:  05 August 2019

Santhana Eswara ,
Jelena Lovric  and
Tom Wirtz
Santhana Eswara*
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41, rue du Brill, L-4422 Belvaux, Luxembourg.
Jelena Lovric
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41, rue du Brill, L-4422 Belvaux, Luxembourg.
Tom Wirtz
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41, rue du Brill, L-4422 Belvaux, Luxembourg.
*
*Corresponding author: santhana.eswara@list.lu

Abstract

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Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1778 - 1779
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Williams, DB and Carter, CB, The Transmission Electron Microscope (Springer US, Boston, MA, 2009).Google Scholar
[2]Benninghoven, A, Rüdenauer, FG, and Werner, HW, Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends (J. Wiley, New York, 1987).Google Scholar
[3]Yedra, L et al. , Sci. Rep. 6 (2016), p. 28705.Google Scholar
[4]Vollnhals, F et al. , Anal. Chem. 89 (2017), p. 10702.Google Scholar
[5]The authors acknowledge funding from the LowZ-PIES (C13/MS/5951975) and the NACHOS (INTER/SNF/16/11536628) projects funded by the Luxembourg National Research Fund (FNR) by the grant.Google Scholar