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Nanoscale Phonon Mapping of Single SiGe Quantum Dots by Vibrational EELS

Published online by Cambridge University Press:  30 July 2020

Chaitanya Gadre ,
Xingxu Yan ,
Qichen Song ,
Jie Li ,
Lei Gu ,
Toshihiro Aoki ,
Sheng-Wei Lee ,
Gang Chen ,
Ruqian Wu  and
Xiaoqing Pan
Chaitanya Gadre
Affiliation:
University of California - Irvine, Irvine, California, United States
Xingxu Yan
Affiliation:
University of California - Irvine, Irvine, California, United States
Qichen Song
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Jie Li
Affiliation:
University of California - Irvine, Irvine, California, United States
Lei Gu
Affiliation:
University of California - Irvine, Irvine, California, United States
Toshihiro Aoki
Affiliation:
University of California - Irvine, Irvine, California, United States
Sheng-Wei Lee
Affiliation:
National Central University, Taoyuan, Taoyuan, Taiwan (Republic of China)
Gang Chen
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Ruqian Wu
Affiliation:
University of California - Irvine, Irvine, California, United States
Xiaoqing Pan
Affiliation:
University of California - Irvine, Irvine, California, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 958 - 959
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Copyright
Copyright © Microscopy Society of America 2020

References

He, Jian, and Tritt, Terry M.. “Advances in thermoelectric materials research: Looking back and moving forward.” Science 357.6358 (2017): eaak9997.10.1126/science.aak9997CrossRefGoogle ScholarPubMed
Biswas, Kanishka, et al. “High-performance bulk thermoelectrics with all-scale hierarchical architectures.” Nature 489.7416 (2012): 414.10.1038/nature11439CrossRefGoogle ScholarPubMed
Krivanek, Ondrej L., et al. “Vibrational spectroscopy in the electron microscope.” Nature 514.7521 (2014): 209.10.1038/nature13870CrossRefGoogle ScholarPubMed
The authors acknowledge the support of the University of California Irvine Materials Research Institute for the use of TEM facilities.Google Scholar