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THE NANOWORKBENCH: Automated Nanorobotic system inside of Scanning Electron or Focused Ion Beam Microscopes
Published online by Cambridge University Press: 25 July 2016
Abstract
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- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 14 - 15
- Copyright
- © Microscopy Society of America 2016
References
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Lim, Seong Chu, Kim, Keun Soo & An, Kay Hyeok Dept. of Phys., Sungkyunkwan University, Korea (2002).Google Scholar
[5] Supported by European Commission, IST and Ziel2.NRW.Google Scholar