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National Institute of Standards and Technology - Texas Instruments Industrial Collaboratory Testbed

Published online by Cambridge University Press:  02 July 2020

Michael T. Postek ,
Marylyn Bennett ,
Nestor J. Zaluzec ,
Thomas Wheatley  and
Samuel Jones
Michael T. Postek
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20899
Marylyn Bennett
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20899
Nestor J. Zaluzec
Affiliation:
Texas Instruments, Inc., Dallas, TX, 75243
Thomas Wheatley
Affiliation:
University of Illinois, Chicago, IL, 60607& Argonne National Lab, Argonne, II, 60439
Samuel Jones
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20899
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Extract

One of the missions of the NIST Manufacturing Engineering Laboratory (MEL) is to improve and advance length metrology in aid of U.S. Industry. This responsibility is found within the Precision Engineering Division (PED). The successful development of a “Collaboratory” for TelePresence Microscopy provides an important new tool to promote technology transfer in the area of length metrology and measurement technology. NIST and Texas Instruments, under the auspices of the National Advanced Manufacturing Testbed (NAMT) and in collaboration with the University of Illinois are developing a microscopy collaboratory testbed. This facility is designed to demonstrate the value of telepresence microscopy within a large distributed manufacturing facility such as Texas Instruments and between organizations such as NIST, Texas Instruments and Universities.

Telepresence Microscopy is an application of the state-of-the-art Internet based technology to long-distance scientific endeavors.

Type
Advances in Remote Microscopy, Instrument Automation and Data Storage
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 22 - 23
Copyright
Copyright © Microscopy Society of America

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References

References:

1) Contribution of the National Institute of Standards and Technology. Not subject to copyright.Google Scholar
2)Zaluzec, N.J.Proceedings of 1995 Microscopy & Microanalysis Meeting, Kansas City. 1995 pg 14Google Scholar
3) Certain Commercial Equipment is identified in this report in order to adequately describe the experimental procedure. Such identification does not imply recommendation or endorsement by NIST, nor does it imply that the equipment identified is necessarily the best available for the purpose.Google Scholar
4) M.C. Wright et al. these proceedingsGoogle Scholar