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A New EPMA Method For Fast Trace Element Analysis In Simple Matrices

Published online by Cambridge University Press:  27 August 2014

John J. Donovan  and
John T. Armstrong
John J. Donovan
Affiliation:
CAMCOR, University of Oregon, Eugene, OR, 97403
John T. Armstrong
Affiliation:
Carnegie Institution for Science, Geophysical Lab, Washington, DC, NW, 20015-1305

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 724 - 725
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Donovan, JJ, Lowers, HA, Rusk, BG (2011) Improved Electron Probe Microanalysis of Trace Elements in Quartz, American Mineralogist, 96, 274-282.Google Scholar
[2] Allaz, J, Williams, ML, Jercinovic, MJ, and Donovan, JJ (in preparation) Multipoint Background Method: Gaining precision and accuracy in electron microprobe trace element analysis. To be submitted to Chemical Geology.Google Scholar
[3] Armstrong, JT (1988) Quantitative Analysis of Silicate and Oxide Materials: Comparison of Monte Carlo, ZAF, and Procedures, Microbeam Analysis, 239-246.Google Scholar
[4] Donovan, JJand Tingle, T (1996), An Improved Mean Atomic Number Background Correction for Quantitative Microanalysis, Jour. of Micros. Microa., 1-7.Google Scholar