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New Technology and Approaches for the Acceleration and Enhancement of Microstructural Characterization using Electron Backscatter Diffraction
Published online by Cambridge University Press: 23 September 2015
Abstract
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- Abstract
- Information
- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1173 - 1174
- Copyright
- Copyright © Microscopy Society of America 2015
References
[2]
Wright, S., Nowell, M. & Field, D., Microscopy and Microanalysis
17 (2011), p 316.CrossRefGoogle Scholar
[3]
Fizanne-Michel, C., et al, Materials Science and Engineering A
613 (2014), p 159.CrossRefGoogle Scholar