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New tools for Micro-Characterization at low Beam voltages (The right tools for the right Job)

Published online by Cambridge University Press:  01 August 2002

Del Redfern  and
Joe Nicolosi
Del Redfern
Affiliation:
EDAX Inc. Mahwah, NJ, USA
Joe Nicolosi
Affiliation:
EDAX Inc. Mahwah, NJ, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 714 - 715
Copyright
Copyright © Microscopy Society of America 2002