Hostname: page-component-7479d7b7d-qs9v7 Total loading time: 0 Render date: 2024-07-09T08:25:41.432Z Has data issue: false hasContentIssue false
  • English
  • Français

The New X-ray Mapping: Applying the Silicon Drift Detector (SDD) for X-ray Spectrometry and Spectrum Imaging with Output Count Rates above 100 kHz

Published online by Cambridge University Press:  01 August 2005

D E Newbury
D E Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1328 - 1329
Copyright
© 2005 Microscopy Society of America