No CrossRef data available.
Article contents
The novel approach to correlative microscopy using AFM-in-SEM and CPEM technology
Published online by Cambridge University Press: 30 July 2021
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Vendor Symposium
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Sample courtesy: Ute Heinemeyer, BASF, Ludwigshafen am Rhein, Germany.Google Scholar
You have
Access