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The novel approach to correlative microscopy using AFM-in-SEM and CPEM technology

Published online by Cambridge University Press:  30 July 2021

Veronika Hegrova
Affiliation:
NenoVision, Brno, Czech Republic
Josef Horak
Affiliation:
NenoVision, Czech Republic
Zdenek Novacek
Affiliation:
NenoVision, Czech Republic
Michal Pavera
Affiliation:
NenoVision, Czech Republic
Jan Neuman
Affiliation:
NenoVision, Czech Republic

Abstract

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Type
Vendor Symposium
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Sample courtesy: Ute Heinemeyer, BASF, Ludwigshafen am Rhein, Germany.Google Scholar