Hostname: page-component-68945f75b7-wph62 Total loading time: 0 Render date: 2024-08-05T16:39:15.321Z Has data issue: false hasContentIssue false
  • English
  • Français

A Novel Technique for Visualizing Electron Beam Induced Charging

Published online by Cambridge University Press:  24 July 2003

Xiaohu Tang  and
David C Joy
Xiaohu Tang
Affiliation:
Electron Microscope Facility, University of Tennessee, Knoxville, TN 37996-0840 USA
David C Joy
Affiliation:
Electron Microscope Facility, University of Tennessee, Knoxville, TN 37996-0840 USA Oak Ridge National Laboratory, Oak Ridge, TN 37831-6064 USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 980 - 981
Copyright
Copyright © Microscopy Society of America 2003