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Opportunities of in situ TEM for measuring voltage-driven microstructural changes in memristive devices
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Type
- Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
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- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
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This work was partially supported by the MIT-IBM Watson AI Lab and made use of facilities and instrumentation supported by NSF through the Massachusetts Institute of Technology Materials Research Science and Engineering Center DMR-1419807, as well as facilities at MIT.nano.Google Scholar
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