Optimisation of Cryo-SEM and How to Minimize Artefacts

M Carey

doi:10.1017/S1431927609093362

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Optimisation of Cryo-SEM and How to Minimize Artefacts

Published online by Cambridge University Press: 26 July 2009

M Carey

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M Carey*: Affiliation:
Gatan UK,United Kingdom

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 928 - 929

DOI: https://doi.org/10.1017/S1431927609093362 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2009

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Optimisation of Cryo-SEM and How to Minimize Artefacts

Volume 15, Supplement S2
M Carey ^(a1)
DOI: https://doi.org/10.1017/S1431927609093362

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Optimisation of Cryo-SEM and How to Minimize Artefacts

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