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Optimizing STEM Imaging Conditions Towards Reliable Representation of Single Atom Catalysts
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
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- Copyright © Microscopy Society of America 2022
References
Isaacson, MS et al. , Proceedings of the National Academy of Sciences 74 (1977), p. 1802.CrossRefGoogle Scholar
The microscopy work was supported by an Early Career project supported by DOE Office of Science FWP #ERKCZ55–KC040304. All microscopy technique development was performed and supported by Oak Ridge National Laboratory's (ORNL) Center for Nanophase Materials Sciences (CNMS), which is a DOE Office of Science User Facility. This manuscript has been authored by UT-Battelle, LLC, under Contract No. DE-AC0500OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for the United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-planGoogle Scholar