Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-26T04:14:57.908Z Has data issue: false hasContentIssue false
  • English
  • Français

Oxygen Vacancies at Grain Boundaries in Doubly-Doped Ceria Determined using EELS

Published online by Cambridge University Press:  27 August 2014

W. J. Bowman ,
J. Zhu ,
Z. Hussaini  and
P. A. Crozier
W. J. Bowman
Affiliation:
School for the Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, Arizona 85287-6106
J. Zhu
Affiliation:
School for the Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, Arizona 85287-6106
Z. Hussaini
Affiliation:
School for the Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, Arizona 85287-6106
P. A. Crozier
Affiliation:
School for the Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, Arizona 85287-6106

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1926 - 1927
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Fergus, J., et al., eds. Solid oxide fuel cells: materials properties and performance. CRC press (2008).Google Scholar
[2] Guo, X., et al., Journal of The Electrochemical Society, 148 (3) E121-E126 (2001).Google Scholar
[3] Avila-Paredes, H.J., et al., Solid State Ionics 177 (2006) 3075-3080.Google Scholar
[4] Rehr, J.J., et al., Physical Chemistry Chemical Physics (2010). 12 (21) 5503-5513.Google Scholar
5. We thank the National Science Foundation’s Graduate Research Fellowship Program (DGE-1311230), NSF DMR 1308085, and ASU/NASA Space Grant Program for funding this work. We also gratefully acknowledge support of ASU’s John M. Cowley Center for High Resolution Electron Microscopy and Kevin Jorrisen of the University of Washington for help with FEFF codes.Google Scholar