Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-26T18:32:54.631Z Has data issue: false hasContentIssue false
  • English
  • Français

Performance Advances in LEAP systems

Published online by Cambridge University Press:  27 August 2014

R.M. Ulfig ,
D.J. Larson ,
T.F. Kelly ,
P.H. Clifton ,
T.J. Prosa ,
D.R Lenz  and
E.X. Oltman
R.M. Ulfig
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA
D.J. Larson
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA
T.F. Kelly
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA
P.H. Clifton
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA
T.J. Prosa
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA
D.R Lenz
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA
E.X. Oltman
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1120 - 1121
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Larson, D.J., et al., “Local Electrode Atom Probe Tomography” (Springer, New York (2014) p. 318.Google Scholar
[2] Miller, M.K. Forbes, R.G. Materials Characterization 60 (2009) p. 461.Google Scholar
[3] Meisenkothen, F., et.al., Microsc and Microanal, 20(S2 (2014) these proceedings.Google Scholar