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Performance and Applications of the Aberration Corrected TEM and STEM Instruments at the Ernst Ruska-Centre

Published online by Cambridge University Press:  05 August 2007

J Mayer ,
L Houben ,
S Lopatin ,
M Luysberg  and
A Thust
J Mayer
Affiliation:
Research Centre Juelich,Germany
L Houben
Affiliation:
Research Centre Juelich,Germany
S Lopatin
Affiliation:
FEI Company,Netherlands
M Luysberg
Affiliation:
Research Centre Juelich,Germany
A Thust
Affiliation:
Research Centre Juelich,Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 128 - 129
Copyright
© 2007 Microscopy Society of America

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