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Phase Identification of III-N Thin Films Grown by Molecular Beam Epitaxy and Migration Enhanced Epitaxy using Precession Electron Diffraction
Published online by Cambridge University Press: 04 August 2017
Abstract
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- Information
- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1484 - 1485
- Copyright
- © Microscopy Society of America 2017
References
[4] The work was supported by SENER-CONACYT Project number 151076 and by the National Institute on Minority Health and Health Disparities of the NIH grant G12MD007591.Google Scholar