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Phase-residue Removal Based on Sparse Modeling in Electron Holography
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Takahashi, Y. et al. , Microsc. Microanal. 27 (Suppl. 1) (2021) 2308.10.1017/S1431927621008308CrossRefGoogle Scholar
Anada, S. et al. , Ultramicroscopy 206 (2019) 112818.10.1016/j.ultramic.2019.112818CrossRefGoogle Scholar
This work was supported by Innovative Science and Technology Initiative for Security Grant Number JPJ004596, ATLA, Japan.Google Scholar