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Picometer-Precision Strain Mapping of Two-Dimensional Heterostructures using an Electron Microscope Pixel Array Detector (EMPAD)

Published online by Cambridge University Press:  04 August 2017

Yimo Han ,
Saien Xie ,
Kayla Nguyen ,
Michael Cao ,
Mark W. Tate ,
Prafull Purohit ,
Sol M. Gruner ,
Jiwoong Park  and
David A. Muller
Yimo Han
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA
Saien Xie
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA Department of Chemistry, Institute for Molecular Engineering, and James Franck Institute, University of Chicago, Chicago, IL 60637, USA
Kayla Nguyen
Affiliation:
Chemistry and Chemical Biology Department, Cornell University, Ithaca, NY 14853, USA
Michael Cao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA
Mark W. Tate
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853, USA
Prafull Purohit
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853, USA
Sol M. Gruner
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853, USA Physics Department, Cornell University, Ithaca, NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA Cornell High Energy Synchrotron Source, Cornell University, Ithaca, NY 14853, USA
Jiwoong Park
Affiliation:
Department of Chemistry, Institute for Molecular Engineering, and James Franck Institute, University of Chicago, Chicago, IL 60637, USA Chemistry and Chemical Biology Department, Cornell University, Ithaca, NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1712 - 1713
Copyright
© Microscopy Society of America 2017 

References

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[5] Tate, M. W., et al, Microscopy and Microanalysis 22 2016). p. 237–249.CrossRefGoogle Scholar
[6] Muller, D. A., et al, Microscopy and Microanalysis 22(S3 2016). p. 846–847.CrossRefGoogle Scholar
[7] Work supported by the CCMR, an NSF MRSEC (DMR-1120296).Google Scholar