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Plasma Cleaning Improves the Image Quality of Serial Block-face Scanning Electron Microscopy (SBFSEM) Volumetric Data Sets

Published online by Cambridge University Press:  04 August 2017

Barbara Armbruster
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA
Christopher Booth
Affiliation:
Gatan, Inc., Pleasanton, CA, USA
Stuart Searle
Affiliation:
Gatan UK, Abingdon, Oxon, United Kingdom
Michael Cable
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA
Ronald Vane
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

Denk, W & Horstman, H PLoS Biol 2 2004). p 1900.Google Scholar
Leapman, R, et al, Microsc. Microanal 22(Suppl 3p 1104.Google Scholar
Vane, R & Kosmowska, E Microsc. Microanal. 22(Suppl 3p 46.Google Scholar