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Practical Aspects of X-Ray Mapping in Electron Probe Microanalysis of Minerals

Published online by Cambridge University Press:  22 July 2022

Karsten Goemann
Affiliation:
Central Science Laboratory, University of Tasmania, Hobart, Australia
Adam Abersteiner
Affiliation:
School of Natural Sciences, University of Tasmania, Hobart, Australia Department of Geosciences and Geography, University of Helsinki, Helsinki, Finland Institute of Volcanology and Seismology, Far East Branch, Russian Academy of Sciences, Petropavlovsk-Kamchatsky, Russia
Vadim S. Kamenetsky
Affiliation:
School of Natural Sciences, University of Tasmania, Hobart, Australia Institute of Experimental Mineralogy, RAS, Chernogolovka, Russia

Abstract

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Type
Quantitative and Qualitative Mapping of Materials
Copyright
Copyright © Microscopy Society of America 2022

References

Donovan, JJ et al. , American Mineralogist 106 (2021), 17171735. doi:10.2138/am-2021-7739CrossRefGoogle Scholar
Donovan, JJ and Tingle, TN, J. Microsc. Soc. Am. 2 (1996), 17.Google Scholar
Abersteiner, A et al. , Lithos 372–373 (2020), 105690. doi:10.1016/j.lithos.2020.105690CrossRefGoogle Scholar
Batanova, VG et al. , Chem. Geol. 419 (2015), 149157. doi:10.1016/j.chemgeo.2015.10.042CrossRefGoogle Scholar
Welsch, B et al. , Geology 42 (2014), 867870. doi: 10.1130/G35691.1CrossRefGoogle Scholar
Abersteiner, A et al. , J. Petrol. (2022), submitted.Google Scholar