Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
HARDIN, T.J.
RUGGLES, T.J.
KOCH, D.P.
NIEZGODA, S.R.
FULLWOOD, D.T.
and
HOMER, E.R.
2015.
Analysis of traction‐free assumption in high‐resolution EBSD measurements.
Journal of Microscopy,
Vol. 260,
Issue. 1,
p.
73.
Fullwood, David
Vaudin, Mark
Daniels, Craig
Ruggles, Timothy
and
Wright, Stuart I.
2015.
Validation of kinematically simulated pattern HR-EBSD for measuring absolute strains and lattice tetragonality.
Materials Characterization,
Vol. 107,
Issue. ,
p.
270.
Guyon, J.
Mansour, H.
Gey, N.
Crimp, M.A.
Chalal, S.
and
Maloufi, N.
2015.
Sub-micron resolution selected area electron channeling patterns.
Ultramicroscopy,
Vol. 149,
Issue. ,
p.
34.
Jackson, Brian E.
Christensen, Jordan J.
Singh, Saransh
De Graef, Marc
Fullwood, David T.
Homer, Eric R.
and
Wagoner, Robert H.
2016.
Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction.
Microscopy and Microanalysis,
Vol. 22,
Issue. 4,
p.
789.
Wright, Stuart I.
Suzuki, Seiichi
and
Nowell, Matthew M.
2016.
In Situ EBSD Observations of the Evolution in Crystallographic Orientation with Deformation.
JOM,
Vol. 68,
Issue. 11,
p.
2730.
Orme, Andrew D.
Chelladurai, Isaac
Rampton, Travis M.
Fullwood, David T.
Khosravani, Ali
Miles, Michael P.
and
Mishra, Raja K.
2016.
Insights into twinning in Mg AZ31: A combined EBSD and machine learning study.
Computational Materials Science,
Vol. 124,
Issue. ,
p.
353.
Ruggles, T.J.
Rampton, T.M.
Khosravani, A.
and
Fullwood, D.T.
2016.
The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopy.
Ultramicroscopy,
Vol. 164,
Issue. ,
p.
1.
Nowell, Matthew M.
and
Wright, Stuart I.
2017.
Thoughts on Standards Materials and Analytical Routines for Electron Backscatter Diffraction (EBSD).
Microscopy and Microanalysis,
Vol. 23,
Issue. S1,
p.
510.
Sharma, Nitin Kumar
and
Shekhar, Shashank
2018.
Deconvoluting error in measurement of low angle misorientation distribution.
Micron,
Vol. 107,
Issue. ,
p.
28.
Ruggles, T.J.
Bomarito, G.F.
Qiu, R.L.
and
Hochhalter, J.D.
2018.
New levels of high angular resolution EBSD performance via inverse compositional Gauss–Newton based digital image correlation.
Ultramicroscopy,
Vol. 195,
Issue. ,
p.
85.
Zhu, Chaoyi
Kaufmann, Kevin
and
Vecchio, Kenneth
2019.
Automated Reconstruction of Spherical Kikuchi Maps.
Microscopy and Microanalysis,
Vol. 25,
Issue. 4,
p.
912.
Winkelmann, Aimo
Nolze, Gert
Cios, Grzegorz
Tokarski, Tomasz
and
Bała, Piotr
2020.
Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps.
Materials,
Vol. 13,
Issue. 12,
p.
2816.
Zhu, Chaoyi
Kaufmann, Kevin
and
Vecchio, Kenneth S.
2020.
Novel remapping approach for HR-EBSD based on demons registration.
Ultramicroscopy,
Vol. 208,
Issue. ,
p.
112851.
Shekhar, Shashank
Sharma, Nitin Kumar
Sahu, Sandeep
and
Misra, Santanu
2022.
Electron Microscopy in Science and Engineering.
Vol. 6,
Issue. ,
p.
35.
Ruggles, Timothy
Grutzik, Scott J.
and
Michael, Joseph R.
2022.
Determining Stress in Metallic Conducting Layers of Microelectronics Devices Using High Resolution Electron Backscatter Diffraction and Finite Element Analysis.
SSRN Electronic Journal ,
Ruggles, Timothy
Grutzik, Scott
Stephens, Kelly
and
Michael, Joseph
2023.
Determining Stress in Metallic Conducting Layers of Microelectronics Devices Using High Resolution Electron Backscatter Diffraction and Finite Element Analysis.
Microscopy and Microanalysis,
Vol. 29,
Issue. 2,
p.
490.