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Preparation of Atom Probe Specimens Containing Individual Nanoparticles

Published online by Cambridge University Press:  22 July 2022

Mark McLean  and
Frederick Meisenkothen
Mark McLean*
Affiliation:
Material Measurement Science Division, National Institute of Standards & Technology, Gaithersburg, MD, United States
Frederick Meisenkothen
Affiliation:
Material Measurement Science Division, National Institute of Standards & Technology, Gaithersburg, MD, United States
*
*Corresponding author: mark.mclean@nist.gov

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 70 - 71
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Copyright
Copyright © Microscopy Society of America 2022

References

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