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Probing Deformation Mechanisms in Ultrafine Grained Al and Au Thin Films by Quantitative In Situ TEM Deformation

Published online by Cambridge University Press:  30 July 2020

Josh Kacher ,
Sandra Stangebye ,
Saurabh Gupta  and
Olivier Pierron
Josh Kacher
Affiliation:
Georgia Institute of Technology, Atlanta, Georgia, United States
Sandra Stangebye
Affiliation:
Georgia Institute of Technology, Atlanta, Georgia, United States
Saurabh Gupta
Affiliation:
Georgia Institute of Technology, Atlanta, Georgia, United States
Olivier Pierron
Affiliation:
Georgia Institute of Technology, Atlanta, Georgia, United States

Abstract

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Type
In Situ TEM at the Extremes - Mechanical
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 3188 - 3190
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Copyright
Copyright © Microscopy Society of America 2020

References

Kacher, J., et al. . Current Opinion in Solid State and Materials Science, 2014. 18(4): p. 227-243.10.1016/j.cossms.2014.05.004CrossRefGoogle Scholar
Kacher, J., et al. Materials Science and Engineering A, 2011. 528(3): p. 1628-1635.10.1016/j.msea.2010.10.109CrossRefGoogle Scholar
Gupta, S. and Pierron, O.N., Journal of Microelectromechanical Systems, 2017. 26(5): p. 1082-1092.10.1109/JMEMS.2017.2708522CrossRefGoogle Scholar
Kacher, J., et al. . Current Opinion in Solid State and Materials Science, 2019. 23(3): p. 117-128.10.1016/j.cossms.2019.03.003CrossRefGoogle Scholar