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Probing Mobile-point-defect-mediated Nanodomain Evolutions in Ferroelastic-ferroelectrics Under High Stress with In-situ TEM

Published online by Cambridge University Press:  30 July 2020

Yu Deng ,
Jim Ciston ,
Karen Bustillo ,
Colin Ophus ,
Ruopeng Zhang ,
Chengyu Song ,
Christoph Gammer  and
Andrew Minor
Yu Deng
Affiliation:
Nanjing University, Nanjing, Jiangsu, China (People's Republic)
Jim Ciston
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Karen Bustillo
Affiliation:
NCEM, Molecular Foundry, LBNL, Berkeley, California, United States
Colin Ophus
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Ruopeng Zhang
Affiliation:
University of California-Berkeley, Berkeley, California, United States
Chengyu Song
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Christoph Gammer
Affiliation:
Austrian Academy of Sciences, Leoben, Wien, Austria
Andrew Minor
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States University of California-Berkeley, Berkeley, California, United States

Abstract

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Type
In Situ TEM at the Extremes
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2418 - 2419
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Copyright
Copyright © Microscopy Society of America 2020

References

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