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Probing Nanoscale Local Lattice Strains in Semiconductor Nanostructures and Devices by Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Jinguo Wang ,
Guoda Lian  and
Moon J. Kim
Jinguo Wang
Affiliation:
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas, USA
Guoda Lian
Affiliation:
IBM System & Technology Group, Hopewell Junction, NY, USA
Moon J. Kim
Affiliation:
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 972 - 973
Copyright
© Microscopy Society of America 2018 

References

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[2] Kang, C.Y., et al, Appi. Phys. Lett. 91 2007) p. 033511–0335113.Google Scholar
[3] Wang, J.G., et al, Appi. Phys. Lett. 93 2008) p. 161913.Google Scholar
[4] Sun, C., et al, Scientific Reports 6 2016) Article number, 27009.Google Scholar
[5] This work was supported in part by Louis Beecherl, Jr. endowment funds..Google Scholar