Hostname: page-component-848d4c4894-mwx4w Total loading time: 0 Render date: 2024-06-28T06:28:07.965Z Has data issue: false hasContentIssue false
  • English
  • Français

Progress in a New Method of Thickness Measurement by X-ray Analysis in TEM

Published online by Cambridge University Press:  04 August 2017

J. Sagar ,
P. Statham ,
J. Holland ,
P. Pinard  and
S. Lozano-Perez
J. Sagar
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, U.K.
P. Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, U.K.
J. Holland
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, U.K.
P. Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, U.K.
S. Lozano-Perez
Affiliation:
University of Oxford, Department of Materials, Oxford, U.K.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 30 - 31
Copyright
© Microscopy Society of America 2017 

References

[1] Statham, P., et al, Microscopy and Microanalysis 22(S3 2016). p. 38–39.CrossRefGoogle Scholar
[2] Rowlands, N., et al, Microsc. Microanal 19(S2 2013). p. 1074–1075.Google Scholar
[3] Zaluzec, N. Microsc. Microanal 20 2014). p. 1318–1326.Google Scholar
[4] Malis, T., et al, J. Elec. Microsc. Tech 8 1988). p. 193–200.CrossRefGoogle Scholar
[5] Iakoubovskii, K., et al, Physical Review B 77 2008 104102.CrossRefGoogle Scholar