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Progress in Ultra-High Energy Resolution EELS

Published online by Cambridge University Press:  05 August 2019

TC Lovejoy*
Affiliation:
Nion R&D, Kirkland, WA, USA.
GJ Corbin
Affiliation:
Nion R&D, Kirkland, WA, USA.
N Dellby
Affiliation:
Nion R&D, Kirkland, WA, USA.
N Johnson
Affiliation:
Nion R&D, Kirkland, WA, USA.
MV Hoffman
Affiliation:
Nion R&D, Kirkland, WA, USA.
A Mittelberger
Affiliation:
Nion R&D, Kirkland, WA, USA.
OL Krivanek
Affiliation:
Nion R&D, Kirkland, WA, USA. Department of Physics, Arizona State University, Tempe AZ, USA.
*
*Corresponding author: lovejoy@nion.com

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Krivanek, OL et al. , Nature 514 (2014), p. 209; T Miata et al., Microscopy 63 (2014), p. 377.Google Scholar
[2]Lovejoy, TC et al. , Microsc. Microanal. 24 (S1) (2018), p. 446.Google Scholar
[3]Krivanek, OL et al. , Microscopy 62 (2013), p. 3.Google Scholar
[4]Rez, P et al. , Nature Comms 7, p. 10945. doi: 10.1038/ncomms10945Google Scholar
[5]Radtke, G et al. , these proceedingsGoogle Scholar
[6]Hachtel, J et al. , Science 363 (2019), p. 525.Google Scholar
[7]Dwyer, C et al. , Phys. Rev. Lett 117 (2016), p. 256101.Google Scholar
[8]Hage, FS et al. , Phys. Rev. Lett 122 (2019), p. 016103.Google Scholar
[9]Venkatraman, K et al. , arXiv:1812.08895 (2018).Google Scholar
[10]Hage, FS et al. , Sci. Adv. 4 (2018), p. 1. eaar7495.Google Scholar