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Quantifying Pb in Microelectronic Electrodes to Mitigate Sn Whisker Growth with the Use of Energy Dispersive X-Ray Spectroscopy (EDS) and Image Analysis

Published online by Cambridge University Press:  22 July 2022

Luis Jauregui ,
Rebecca Wheeling  and
Jeier Yang
Luis Jauregui*
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Rebecca Wheeling
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Jeier Yang
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
*
*Corresponding author: ljjaure@sandia.gov

Abstract

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Type
Quantitative and Qualitative Mapping of Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 564 - 565
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Copyright
Copyright © Microscopy Society of America 2022

References

Tu, King-Nigh et al. , Lead-Free Electronic Solders 1 (2006), p 281. doi:10.1007/978-0-387-48433-4_18Google Scholar
Goldstein, Joseph I. et al. , in “Scanning Electron Microscopy and X-Ray Microanalysis”,4th ed. Joseph I. Goldstein et al., (Springer, New York) p.296.Google Scholar
SNL is managed and operated by NTESS under DOE NNSA contract DE-NA0003525.Google Scholar