Hostname: page-component-7bb8b95d7b-l4ctd Total loading time: 0 Render date: 2024-09-07T06:14:45.915Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitation Procedures for Electron Probe Microanalysis of Polished Materials, Thin Films and Particles: The Past and Next Thirty Five Years

Published online by Cambridge University Press:  01 August 2005

J T Armstrong
J T Armstrong
Affiliation:
American University, Washington, DC

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1354 - 1355
Copyright
© 2005 Microscopy Society of America